Extended Team Profile

Elizabeth Carr

Dr. Elizabeth Carr is an applied physicist with experience in solving processing and device problems using surface analysis and other materials characterization tools. She worked as part of the materials characterization group at Hewlett-Packard Laboratories/Agilent Laboratories, focusing on the use of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS) to speed projects within HP/Agilent Laboratories and product divisions. Some key contributions led to increased light output in GaN light-emitting devices, reduced plasma-induced defects in III-V high-speed semiconductor devices, and improved in-situ oligonucleotide synthesis for DNA microarrays.

Liz received a B.S. in Physics from Brown University and M.S. and Ph.D. degrees in Applied Physics from Cornell University. At Cornell, she studied thin silicon oxides for high-density CMOS devices, utilizing XPS to measure nitrogen in N2O-grown oxides and correlate composition to electrical properties. She has 12 publications in refereed journals, and one patent.

Specialties:

Atomic Force Microscopy (AFM)
X-ray Photoelectron Spectroscopy (XPS)
General materials characterization
Thin silicon oxides

Work Experience:

Agilent Laboratories
Hewlett-Packard Laboratories
AT&T Bell Laboratories

Education:

Ph.D. and M.S. in Applied Physics, Cornell University
    • Electrical and Structural Studies of Thin Silicon Oxides (Doctoral Dissertation)
B.S. in Physics, Brown University

Patents and Publications:

Twelve technical publications and one patent